IEC 63364-1 Ed. 1.0:2022 (b)
半導体素子-IoTシステム向け半導体素子-第1部:音変化検出の試験方法
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
発行年月日:
2022-12-14
状態:
有効
邦訳版:
無
英語 24ページ
15,400 円(税込) 本体価格:14,000円
- 規格概要
-
IEC 63364-1:2022 specifies terms, the test method, and the report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.全文を表示する
TC |
TC 47 |
---|---|
ICS |
31.080.99 |
備考 |