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IEC 62951-8 Ed. 1.0:2023 (en)
半導体素子-可とう性及び伸張性半導体素子-第8部:柔軟な抵抗メモリの伸縮性,柔軟性および安定性の試験方法
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

発行年月日: 2023-01-19
状態: 有効
邦訳版: 無

規格概要 IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.
TC TC 47
ICS 31.080.99
備考
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