IEC 61010-031 Ed. 3.0 CMV:2022 (en)
計測，制御及び試験所用電気機器の安全要求事項－第031部：電気計測及び試験のための手持形プローブアセンブリ
Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement
発行年月日：
2022-12-22
状態：
有効
邦訳版：
無
英語 312ページ
148,225 円（税込） 本体価格：134,750円
- 規格概要
-
IEC 61010-031:2022 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC 61010-031:2022 edition 3.0 and the previous IEC 61010-031:2015+AMD1:2018 CSV edition 2.1. Furthermore, comments from IEC TC 66 experts are provided to explain the reasons of the most relevant changes, or to clarify any part of the content.全文を表示する
IEC 61010-031:2022 specifies safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement, and their related accessories. These probe assemblies are for non-contact or direct electrical connection between a part and electrical test and measurement equipment. They can be fixed to the equipment or be detachable accessories for the equipment.
It has the status of a group safety publication in accordance with IEC Guide 104.
This third edition cancels and replaces the second edition published in 2015, and Amendment 1:2018. IEC 61010-031 is a stand-alone standard. This edition includes the following significant technical changes with respect to the previous edition:- the scope has been made succinct. General information from the scope of Edition 2 has been moved to a new Clause 4. Consequently, Clause 4 to Clause 8 of Edition 2 have been renumbered. Clause 9 of Edition 2 has been deleted;
- in Clause 2, normative references have been dated and new normative references have been added;
- in 3.1.4, the definition of probe tip has been modified;
- in 4.1, there is no longer any differentiation between high voltage and low voltage probe assemblies. Type C probe assemblies have been merged with Type B probe assemblies;
- in 4.1 d) Kelvin probes have been added to the list of probe assemblies as
| TC |
TC 66 |
|---|---|
| ICS |
19.080 |
| 備考 |
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