IEC 61000-4-21 Ed. 2.0:2011 (b)
電磁両立性(EMC)－第4-21部：試験及び測定技術－残響室試験方法
Electromagnetic compatibility (EMC) - Part 4-21: Testing and measurement techniques - Reverberation chamber test methods
発行年月日：
2011-01-27
状態：
有効
邦訳版：
無
英語 224ページ
74,112 円（税込） 本体価格：67,375円
- 規格概要
-
IEC 61000-4-21:2011 considers tests of immunity and intentional or unintentional emissions for electric and/or electronic equipment and tests of screening effectiveness in reverberation chambers. It establishes the required test procedures for performing such tests. Only radiated phenomena are considered. The objective of IEC 61000-4-21:2011 is to establish a common reference for using reverberation chambers to evaluate the performance of electric and electronic equipment when subjected to radio-frequency electromagnetic fields and for determining the levels of radio-frequency radiation emitted from electric and electronic equipment. IEC 61000-4-21:2011 does not intend to specify the tests to be applied to a particular apparatus or system. Its main aim is to give a general basic reference to all concerned product committees of the IEC. The product committees should select emission limits and test methods in consultation with CISPR. The product committees remain responsible for the appropriate choice of the immunity tests and the immunity test limits to be applied to their equipment. Other methods, such as those covered in IEC 61000-4-3, CISPR 16-2-3 and CISPR 16-2-4 may be used. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision and includes the following significant technical changes with respectto the first edition:- In Clause 8, the use and specifications of E-field probes for application to reverberation chambers has been added.- In Annex A, additional guidance and clarifications on the use of reverberation chambers at relatively low frequencies of operation (i.e., close to the lowest usable frequency of a given chamber) are given, and its implications on the estimation of field uncertainty are outlined.全文を表示する
| TC |
TC 77/SC 77B |
|---|---|
| ICS |
33.100.10 33.100.20 |
| 備考 |
