IEC 60749-41 Ed. 1.0:2020 (b)
半導体素子-機械及び耐候試験方法-第41部:不揮発性メモリデバイスの標準信頼性試験方法
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
発行年月日:
2020-07-22
状態:
有効
邦訳版:
無
英語 44ページ
28,050 円(税込) 本体価格:25,500円
規格概要 | IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94. |
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TC |
TC 47 |
ICS |
31.080.01 |
備考 |