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IEC/TS 63202-2 Ed. 1.0:2021 (en)
太陽電池-第2部:結晶シリコン太陽電池のエレクトロルミネッセンスイメージング
Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells

発行年月日: 2021-12-16
状態: 有効
邦訳版: 無

規格概要
IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.
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TC TC 82
ICS 27.160
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