IEC/TS 62804-1-1 Ed. 1.0:2020 (en)
太陽光発電(PV)モジュール－電位差誘導性出力低下(PID)の検出のための試験方法－第1-1部：結晶シリコン
Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1-1: Crystalline silicon - Delamination
発行年月日：
2020-01-10
状態：
有効
邦訳版：
無
英語 16ページ
15,400 円（税込） 本体価格：14,000円
- 規格概要
-
IEC 62804-1-1:2020 defines procedures to test and evaluate for potential-induced degradation-delamination (PID-d) mode in the laminate of crystalline silicon PV modules-principally those with one or two glass faces. This document evaluates delamination attributable to current transfer between ground and the module cell circuit. Elements driving the delamination that this test is designed to actuate include reduced adhesion associated with damp heat exposure, sodium accumulation at interfaces, and cathodic gas evolution in the cell circuit, metallization, and other components within the PV module activated by the voltage potential. The change in power of crystalline silicon PV modules associated with the stress factors applied (the purview of IEC TS 62804-1) is not considered in the scope.全文を表示する
| TC |
TC 82 |
|---|---|
| ICS |
27.160 |
| 備考 |
