IEC/TS 62607-9-2 Ed. 1.0:2024 (en)
ナノマニュファクチャリング－鍵管理特性－第9-2部：ナノ磁性製品－磁場分布：磁気光学指示フィルム技術
Nanomanufacturing - Key control characteristics - Part 9-2: Nanomagnetic products - Magnetic field distribution: Magneto-optical indicator film technique
発行年月日：
2024-07-16
状態：
有効
邦訳版：
無
英語 771ページ
68,310 円（税込） 本体価格：62,100円
| 規格概要 | IEC TS 62607-9-2:2024, which is a Technical Specification, establishes a standardized method to determine the key control characteristic magnetic field distribution of nanomagnetic materials, structures and devices by the magneto-optical indicator film technique. The magnetic field distribution is derived by utilizing a magneto optical indicator film, which is a thin film of magneto-optic material that is placed on the surface of an object exhibiting a spatially varying magnetic field distribution. The Faraday effect is then employed to measure the magnetic field strength by analysing the rotation of the polarization plane of light passing through the magneto-optic film. The method is applicable for measuring the stray field distribution of flat nanomagnetic materials, structures and devices. - The method can especially be used to perform fast quantitative measurements of stray field distributions at the surface of an object. - The magneto-optic indicator film technique (MOIF) is a fast, non-destructive method, making it an attractive option for materials analysis and testing in the industry. - MOIF measurements can be done without any sample preparation and do not rely on specific surface properties of the object. It can be applied to the characterization of rough samples as well as of samples with non-magnetic cover layers. - MOIF can quantitatively measure magnetic field distributions: with a one-shot measurement which typically takes a few seconds over areas of several square centimetres (over diameters of up to 15 cm with special techniques) in a field range from 1 mT to more than 100 mT with down to 1 m spatial resolution - Although techniques with nano-scale resolution are suitable for analysing the details of magnetic field structure, their ability to characterize larger areas is limited by their scanning area. Therefore, the MOIF technique is an indispensable com |
|---|---|
| TC |
TC 113 |
| ICS |
07.120 |
| 備考 |
