IEC/TS 62607-8-3 Ed. 1.0:2023 (en)
ナノマニュファクチャリング-鍵管理特性-第8-3部:ナノ対応金属酸化物界面装置-アナログ抵抗変化・抵抗変動:電気抵抗測定
Nanomanufacturing - Key control characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices - Analog resistance change and resistance fluctuation: Electrical resistance measurement
発行年月日:
2023-10-20
状態:
有効
邦訳版:
無
英語 18ページ
22,137 円(税込) 本体価格:20,125円
- 規格概要
-
IEC TS 62607-8-3:2023 This part of IEC 62607, which is a Technical Specification, specifies a measurement protocol to determine the key control characteristics全文を表示する
- analogue resistance change, and
- resistance fluctuation
for nano-enabled metal-oxide interfacial devices by
- electrical resistance measurement.
Analogue resistance change as a function of applied voltage pulse is measured in metal-oxide interfacial devices. The linearity in the relationship of the variation of conductance and the pulse number is evaluated using the parameter fitting. The parameter of the resistance fluctuation is simultaneously computed in the fitting process.
- This method is applicable for evaluating computing devices composed of the metal-oxide interfacial device, for example, product-sum circuits, which record the learning process as the analogue resistance change.
TC |
TC 113 |
---|---|
ICS |
07.120 |
備考 |