IEC 61788-17 Ed. 2.0:2021 (b)
超伝導性－第17部：電子特性計測－大面積超電導薄膜の臨界電流と分布測定法
Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
発行年月日：
2021-04-28
状態：
有効
邦訳版：
無
英語 84ページ
51,975 円（税込） 本体価格：47,250円
| 規格概要 | IEC 61788-17:2021 is available as IEC 61788-17:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61788-17:2021 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows. - Jcd: from 200 A/m to 32 kA/m (based on results, not limitation). - Measurement resolution: 100 A/m (based on results, not limitation). |
|---|---|
| TC |
TC 90 |
| ICS |
29.050 |
| 備考 |
