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IEC 61189-2-805 Ed. 1.0:2024 (b)
電気材料,プリント板及びその他の相互接続構体並びにアセンブリの試験方法-第2-805部:TMAによる薄い母材のX/Y CTE試験
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-805: X/Y CTE test for thin base materials by TMA

発行年月日: 2024-04-18
状態: 有効
邦訳版: 無

規格概要 IEC 61189-2-805:2024 defines the method to be followed for the determination of the X/Y coefficient of thermal expansion of thin electrical insulating materials via the use of a thermomechanical analyser (TMA). This method is applicable to materials that are solid for the entire range of temperature used, and that retain sufficient rigidity over the temperature range so that so that irreversible indentation of the specimen by the sensing probe does not occur.
TC TC 91
ICS 31.180
備考
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