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IEC 60749-41 Ed. 1.0:2020 (b)
半導体素子-機械及び耐候試験方法-第41部:不揮発性メモリデバイスの標準信頼性試験方法
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

発行年月日: 2020-07-22
状態: 有効
邦訳版: 無

規格概要
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
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TC TC 47
ICS 31.080.01
備考
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