IEC 60749-24 Ed. 2.0:2025 (b)
半導体素子－機械及び耐候試験方法－第24部：加速水分透過抵抗－不偏HAST
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
発行年月日：
2025-11-27
状態：
有効
邦訳版：
無
英語 18ページ
9,020 円（税込） 本体価格：8,200円
- 規格概要
-
IEC 60749-24:2025 specifies unbiased highly accelerated stress testing (HAST). HAST is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it. Bias is not applied in this test to ensure that the failure mechanisms potentially overshadowed by bias can be uncovered (e.g. galvanic corrosion).全文を表示する
This test is used to identify failure mechanisms internal to the package and is destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) rearrangement of clauses to reposition requirements;
b) addition of two notes to the post-test electrical procedures.
| TC |
TC 47 |
|---|---|
| ICS |
31.080.01 |
| 備考 |
