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IEC 62132-4 Ed. 1.0:2006 (b)
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

Date Published: 2006-02-21
Status: Valid
Japanese:

Standard Abstract
Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.
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TC TC 47/SC 47A
ICS 31.200
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