JEITA EDR-4702
Standard comparison table of quality and reliability test methods for semiconductor devices
Date Published:
1996-03-01
Status:
Valid
Japanese:
Japanese 124pages
JPY 26,800 ( JPY 26,800excl. tax )
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- Standard Abstract
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This technical report is about the standard comparison table of quality and reliability test methods for semiconductor devices.More
| ICS | |
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| Corresponding Standards |
Explanation of Equivalency
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| Referenced JIS Stantards | |
| Referenced Stantards | |
| Remarks |