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JEITA ED-4701/600
Environmental and endurance test methods for semiconductor devices(Specific test for discrete semiconductors)

Date Published: 2013-12-01
Status: Valid
Japanese:

Standard Abstract
This standard specifies the environmental and endurance test methods for semiconductor devices(Specific test for discrete semiconductors).
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Referenced JIS Stantards
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Remarks This standard is written in both Japanese and English.
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