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JEITA EDR-4709A
Study on ESD Test Methods for Semiconductor Components Responding to System Level ESD and Guideline for Assembling on System Boards

Date Published: 2019-11-01
Status: Valid
Japanese:

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Standard Abstract
This technical report is about the study on ESD test methods for semiconductor components responding to system level ESD and guideline for assembling on system boards.
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Corresponding Standards
Referenced JIS Stantards
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Remarks Former No. EDR-4709
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