JEITA ED-4701/302B
Environmental and endurance test methods for semiconductor devices (Stress test I-2)
Date Published:
2025-02-01
Status:
Valid
Japanese:
Japanese 152pages
JPY 32,400 ( JPY 32,400excl. tax )
- Standard Abstract
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This standard specifies the environmental and endurance test methods for semiconductor devices (Stress test I-2).More
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| Corresponding Standards |
Explanation of Equivalency
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| Remarks |