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JEITA ED-4701/100B
Environmental and endurance test methods for semiconductor devices (Life test I)

Date Published: 2023-03-01
Status: Valid
Japanese:

Standard Abstract
This standard specifies the environmental and endurance test methods for semiconductor devices (Life test I).
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Corresponding Standards
Referenced JIS Stantards
Referenced Stantards
Remarks This standard is written in both Japanese and English. Former No. ED-4701/100 ED-4701/100A
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