JEITA ED-4701/100B
Environmental and endurance test methods for semiconductor devices (Life test I)
Date Published:
2023-03-01
Status:
Valid
Japanese:
Japanese 50pages
JPY 12,000 ( JPY 12,000excl. tax )
- Standard Abstract
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This standard specifies the environmental and endurance test methods for semiconductor devices (Life test I).More
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| Corresponding Standards |
Explanation of Equivalency
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| Referenced JIS Stantards | |
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| Remarks | Former No. ED-4701/100 ED-4701/100A |